Publication:

Dynamic flat field correction in edge illumination imaging

Date

2024
Proceedings Paper
https://doi.org/10.1117/12.3028319
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dc.contributor.authorKeklikoglu, Didem Gökbel
dc.contributor.authorFrancken, Nicholas
dc.contributor.authorHuyge, Ben
dc.contributor.authorMerdan, Ziya
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorSijbers, Jan
dc.contributor.imecauthorKeklikoglu, Didem Gokbel
dc.contributor.imecauthorFrancken, Nicholas
dc.contributor.imecauthorHuyge, Ben
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.orcidimecFrancken, Nicholas::0000-0001-6256-9356
dc.contributor.orcidimecHuyge, Ben::0000-0003-3426-885X
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.date.accessioned2025-08-12T03:59:42Z
dc.date.available2025-08-12T03:59:42Z
dc.date.issued2024
dc.description.wosFundingTextDGK was supported by The Scientific and Technological Research Council of Turkiye within the scope of 2214-A - International Research Fellowship Programme for PhD Students. The authors also acknowledge financially support by the Research Foundation - Flanders (FWO) through grant numbers S003421N, G090020N, and 1S46122N.
dc.identifier.doi10.1117/12.3028319
dc.identifier.eisbn978-1-5106-7965-8
dc.identifier.isbn978-1-5106-7964-1
dc.identifier.issn0277-786X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/46057
dc.publisherSPIE-INT SOC OPTICAL ENGINEERING
dc.source.beginpage131521P
dc.source.conference2024 Conference on Developments in X-Ray Tomography
dc.source.conferencedate2024-08-19
dc.source.conferencelocationSan Diego
dc.source.journalProceedings of SPIE
dc.source.numberofpages13
dc.title

Dynamic flat field correction in edge illumination imaging

dc.typeProceedings paper
dspace.entity.typePublication
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