Comparison of assessment methods for in-situ 5G NR base station exposure

Deprez, Kenneth; Verloock, Leen; Colussi, Loek; Aerts, Sam; Van den Bossche, Matthias 2; Kamer, Jos; Bolte, John; Martens, Luc; Plets, David; Joseph, Wout

Publication:

Comparison of assessment methods for in-situ 5G NR base station exposure

Date

2022

Proceedings Paper

Simple item page Full metadata Statistics

Files

Published version 1.61 MB

Author(s)

;

;

;

;

Van den Bossche, Matthias 2

;

;

;

;

;

Journal

Conference paper

Statistics

1 since deposited on 2023-03-24

Acq. date: 2026-08-09

985 since deposited on 2023-03-24

4last month

2last week

Acq. date: 2026-08-09

Comparison of assessment methods for in-situ 5G NR base station exposure

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Downloads

Views

Citations

Statistics

Downloads

Views

Citations