Publication:

IP Session on Chiplet: Design, Assembly, and Test

Date

2023
Proceedings Paper
https://doi.org/10.1109/VTS56346.2023.10140103
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dc.contributor.authorVinnakota, Bapi
dc.contributor.authorDerakhshandeh, Jaber
dc.contributor.authorBeyne, Eric
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorChakravarty, Sreejit
dc.contributor.imecauthorDerakhshandeh, Jaber
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecDerakhshandeh, Jaber::0000-0003-2448-9165
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2023-08-11T07:19:18Z
dc.date.available2023-07-24T17:10:22Z
dc.date.available2023-07-26T14:56:13Z
dc.date.available2023-08-11T07:19:18Z
dc.date.embargo9999-12-31
dc.date.issued2023
dc.identifier.doi10.1109/VTS56346.2023.10140103
dc.identifier.eisbn979-8-3503-4630-5
dc.identifier.issn1093-0167
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42187
dc.publisherIEEE COMPUTER SOC
dc.source.conference41st IEEE VLSI Test Symposium (VTS)
dc.source.conferencedateAPR 24-26, 2023
dc.source.conferencelocationSan Diego
dc.source.journalIEEE VLSI Test Symposium
dc.source.numberofpages1
dc.title

IP Session on Chiplet: Design, Assembly, and Test

dc.typeProceedings paper
dspace.entity.typePublication
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