Publication:
On trap identification in Gate-All-Around (GAA) Nanowire (NW) MOSFETs using Low Frequency Noise spectroscopy
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1884 since deposited on 2021-10-24
1last week
Acq. date: 2026-02-26
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Views
1884 since deposited on 2021-10-24
1last week
Acq. date: 2026-02-26
Citations