Publication:
Degradation and breakdown of MOS gate stacks with high permittivity dielectrics
Date
| dc.contributor.author | Kauerauf, Thomas | |
| dc.contributor.thesisadvisor | Groeseneken, Guido | |
| dc.contributor.thesisadvisor | Maes, Herman | |
| dc.date.accessioned | 2021-10-16T17:03:51Z | |
| dc.date.available | 2021-10-16T17:03:51Z | |
| dc.date.issued | 2007-07 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12388 | |
| dc.title | Degradation and breakdown of MOS gate stacks with high permittivity dielectrics | |
| dc.type | PHD thesis | |
| dspace.entity.type | Publication | |
| Files | ||
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