Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
Publication:
Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
Date
2001
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
5143.pdf
130.68 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Clarysse, Trudo
;
Eyben, Pierre
;
Duhayon, Natasja
;
Xu, Mingwei
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
2010
since deposited on 2021-10-14
439
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2010
since deposited on 2021-10-14
439
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations