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Plasma charging damage issues in copper single and dual damascene, oxide and low-k dielectric interconnects
Publication:
Plasma charging damage issues in copper single and dual damascene, oxide and low-k dielectric interconnects
Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van den bosch, G.
;
De Jaeger, Brice
;
Tokei, Zsolt
;
Groeseneken, Guido
Journal
Abstract
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1891
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1891
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations