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The effect of substrate radiation-induced defects on the operation of deep submicron silicon technologies
Publication:
The effect of substrate radiation-induced defects on the operation of deep submicron silicon technologies
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Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Poyai, Amporn
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Abstract
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1793
since deposited on 2021-10-14
Acq. date: 2026-02-26
Citations
Statistics
Views
1793
since deposited on 2021-10-14
Acq. date: 2026-02-26
Citations