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Evidence for short-channel effect in the radiation response of 0.18μm CMOS transistors

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dc.contributor.authorSimoen, Eddy
dc.contributor.authorHermans, Jan
dc.contributor.authorAugendre, Emmanuel
dc.contributor.authorMarescaux, Théodore
dc.contributor.authorClaeys, Cor
dc.contributor.authorBadenes, Gonçal
dc.contributor.authorMohammadzadeh, A.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHermans, Jan
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHermans, Jan::0000-0003-1249-8902
dc.date.accessioned2021-10-14T13:48:01Z
dc.date.available2021-10-14T13:48:01Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4753
dc.source.beginpage259
dc.source.conferenceProceedings of the RADECS Workshop - Les Actes des Journees Techniques du RADECS
dc.source.conferencedate11/09/2000
dc.source.conferencelocationLouvain-la-Neuve Belgium
dc.source.endpage31
dc.title

Evidence for short-channel effect in the radiation response of 0.18μm CMOS transistors

dc.typeProceedings paper
dspace.entity.typePublication
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