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Quantifying the smoothing of GaN epilayers in MOVPE growth by in-situ laser reflectometry
Publication:
Quantifying the smoothing of GaN epilayers in MOVPE growth by in-situ laser reflectometry
Date
2000
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stafford, A.
;
Irvine, S. J. C.
;
Bougrioua, Zahia
;
Jacobs, Koen
;
Moerman, Ingrid
;
Thrush, E. J.
;
Considine, L.
;
Crawley., J.
Journal
Abstract
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Views
1950
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1950
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations