Machine learning based error detection in transient susceptibility tests

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41796.pdf 1.65 MB

Author(s)

Medico, Roberto

;

Lambrecht, Niels

;

;

Vande Ginste, Dries

;

Deschrijver, Dirk

;

;

Spina, Domenico

Journal

IEEE Transactions on Electromagnetic Compatibility

Metrics

2109 since deposited on 2021-10-27

Acq. date: 2025-10-25