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Machine learning based error detection in transient susceptibility tests
Publication:
Machine learning based error detection in transient susceptibility tests
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Date
2019
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Medico, Roberto
;
Lambrecht, Niels
;
Pues, Hugo
;
Vande Ginste, Dries
;
Deschrijver, Dirk
;
Dhaene, Tom
;
Spina, Domenico
Journal
IEEE Transactions on Electromagnetic Compatibility
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2124
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Views
2124
since deposited on 2021-10-27
5
last month
Acq. date: 2026-08-09
Citations