Publication:
Bias dependence of gate oxide degradation of 90 nm CMOS transistors under 60 MeV proton irradiation
Date
| dc.contributor.author | David, M-L. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Mohammazadeh, A. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T01:06:17Z | |
| dc.date.available | 2021-10-16T01:06:17Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10288 | |
| dc.source.conference | 8th European Conference on Radiation and Its Effects on Components and Systems - RADECS | |
| dc.source.conferencedate | 19/09/2005 | |
| dc.source.conferencelocation | Cap d'Agde France | |
| dc.title | Bias dependence of gate oxide degradation of 90 nm CMOS transistors under 60 MeV proton irradiation | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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