Publication:
Using multisines to measure state-of-the-art analog to digital converters
Date
| dc.contributor.author | Rabijns, Daan | |
| dc.contributor.author | Van Moer, Wendy | |
| dc.contributor.author | Vandersteen, Gerd | |
| dc.contributor.author | Schoukens, Johan | |
| dc.contributor.imecauthor | Vandersteen, Gerd | |
| dc.date.accessioned | 2021-10-16T04:20:33Z | |
| dc.date.available | 2021-10-16T04:20:33Z | |
| dc.date.issued | 2005-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11070 | |
| dc.source.beginpage | 7 | |
| dc.source.conference | Proceedings of the IEEE Instrumentation and Measurement Technology Conference | |
| dc.source.conferencedate | 16/05/2005 | |
| dc.source.conferencelocation | Ottawa Canada | |
| dc.source.endpage | 12 | |
| dc.title | Using multisines to measure state-of-the-art analog to digital converters | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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