Publication:
Statistical model for MOSFET bias temperature instability component due to charge trapping
Date
| dc.contributor.author | Wirth, Gilson | |
| dc.contributor.author | da Silva, Roberto | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-19T21:51:35Z | |
| dc.date.available | 2021-10-19T21:51:35Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2011 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20154 | |
| dc.source.beginpage | 2743 | |
| dc.source.endpage | 2751 | |
| dc.source.issue | 8 | |
| dc.source.journal | IEEE Transactions on Electron Devices | |
| dc.source.volume | 58 | |
| dc.title | Statistical model for MOSFET bias temperature instability component due to charge trapping | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |