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Scanning spreading resistance microscopy for electrical characterization of diamond interfacial layers
Publication:
Scanning spreading resistance microscopy for electrical characterization of diamond interfacial layers
Date
2015
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xu, Blair
;
Hantschel, Thomas
;
Tsigkourakos, Menelaos
;
Vandervorst, Wilfried
Journal
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1902
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1902
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations