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Atomically precise impurity identification and modification on the manganese doped GaAs(110) surface with scanning tunneling microscopy
Publication:
Atomically precise impurity identification and modification on the manganese doped GaAs(110) surface with scanning tunneling microscopy
Date
2008-08
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Garleff, J. K.
;
Celebi, C.
;
Van Roy, Wim
;
Tang, J. M.
;
Flatte, M. E.
;
Koenraad, P. M.
Journal
Physical Review B
Abstract
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1961
since deposited on 2021-10-17
441
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1961
since deposited on 2021-10-17
441
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations