Publication:

Investigation of Ni fully silicided gates for sub-45 nm CMOS technologies

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1925 since deposited on 2021-10-15
1last month
Acq. date: 2026-03-16

Citations

Statistics

Views

1925 since deposited on 2021-10-15
1last month
Acq. date: 2026-03-16

Citations