Publication:

A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment

Date

2020
Proceedings Paper
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dc.contributor.authorKan, Duygu
dc.contributor.authorDe Ridder, Simon
dc.contributor.authorSpina, Domenico
dc.contributor.authorDhaene, Tom
dc.contributor.authorRogier, Hendrik
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorGrassi, Flavia
dc.contributor.imecauthorKan, Duygu
dc.contributor.imecauthorDe Ridder, Simon
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorDhaene, Tom
dc.contributor.imecauthorRogier, Hendrik
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecKan, Duygu::0000-0001-8789-9087
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecRogier, Hendrik::0000-0001-8139-2736
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.accessioned2022-01-05T10:24:59Z
dc.date.available2021-11-02T16:03:22Z
dc.date.available2022-01-05T10:24:59Z
dc.date.issued2020
dc.identifier.eisbn978-1-7281-4204-3
dc.identifier.issn2475-9481
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38051
dc.publisherIEEE
dc.source.conference24th IEEE Workshop on Signal and Power Integrity (SPI)
dc.source.conferencedateMAY 17-20, 2020
dc.source.conferencelocationCologne
dc.source.journalna
dc.source.numberofpages4
dc.subject.keywordsVARIABILITY ANALYSIS
dc.subject.keywordsPOLYNOMIAL-CHAOS
dc.title

A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment

dc.typeProceedings paper
dspace.entity.typePublication
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