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Selective growth of strained GE channel on relaxed SiGe buffer in shallow trench isolation for high mobility Ge planar and Fin pFET
Publication:
Selective growth of strained GE channel on relaxed SiGe buffer in shallow trench isolation for high mobility Ge planar and Fin pFET
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Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vincent, Benjamin
;
Witters, Liesbeth
;
Richard, Olivier
;
Hikavyy, Andriy
;
Bender, Hugo
;
Loo, Roger
;
Caymax, Matty
;
Thean, Aaron
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1753
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations
Metrics
Views
1753
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations