Publication:
Impact of processing and back-gate biasing conditions on the low-frequency noise of ultra-thin buried oxide silicon-on-insulator nMOSFETs
Date
| dc.contributor.author | Kudina, Valeriya | |
| dc.contributor.author | Garbar, Nicolai | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-22T20:15:15Z | |
| dc.date.available | 2021-10-22T20:15:15Z | |
| dc.date.issued | 2015 | |
| dc.identifier.issn | 0038-1101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25495 | |
| dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0038110114002937 | |
| dc.source.beginpage | 37 | |
| dc.source.endpage | 44 | |
| dc.source.journal | Solid-State Electronics | |
| dc.source.volume | 105 | |
| dc.title | Impact of processing and back-gate biasing conditions on the low-frequency noise of ultra-thin buried oxide silicon-on-insulator nMOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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