Publication:

Challenges for Interconnect Reliability: From Element to System Level

Date

2023
Proceedings Paper
https://doi.org/10.1145/3569052.3578909
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dc.contributor.authorVarela Pedreira, Olalla
dc.contributor.authorZahedmanesh, Houman
dc.contributor.authorDing, Youqi
dc.contributor.authorCiofi, Ivan
dc.contributor.authorCroes, Kristof
dc.contributor.imecauthorZahedmanesh, Houman
dc.contributor.imecauthorDing, Youqi
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorVarela Pedreira, Olalla
dc.contributor.orcidimecZahedmanesh, Houman::0000-0002-0290-691X
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecDing, Youqi::0000-0001-8873-572X
dc.contributor.orcidimecVarela Pedreira, Olalla::0000-0002-2987-1972
dc.date.accessioned2024-03-07T14:38:11Z
dc.date.available2023-11-17T17:43:47Z
dc.date.available2024-03-07T14:38:11Z
dc.date.issued2023
dc.identifier.doi10.1145/3569052.3578909
dc.identifier.eisbn978-1-4503-9978-4
dc.identifier.issnN/A
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43155
dc.publisherASSOC COMPUTING MACHINERY
dc.source.beginpage106
dc.source.conferenceInternational Symposium on Physical Design (ISPD)
dc.source.conferencedateMAR 26-JUN 29, 2023
dc.source.conferencelocationVirtual
dc.source.endpage106
dc.source.journalN/A
dc.source.numberofpages1
dc.title

Challenges for Interconnect Reliability: From Element to System Level

dc.typeProceedings paper
dspace.entity.typePublication
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