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Temperature-accelerated breakdown in ultra-thin SiON dielectrics
Publication:
Temperature-accelerated breakdown in ultra-thin SiON dielectrics
Date
2004
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
O'Connor, Robert
;
Hughes, Greg
;
Degraeve, Robin
;
Kaczer, Ben
Journal
Semiconductor Science and Technology
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2053
since deposited on 2021-10-15
Acq. date: 2025-10-25
Citations
Metrics
Views
2053
since deposited on 2021-10-15
Acq. date: 2025-10-25
Citations