Publication:
Status update on a new class of solution processable low-k dielectric coating for use as ILD with k <2.4
Date
| dc.contributor.author | Pakbaz, Hash | |
| dc.contributor.author | Hacker, N | |
| dc.contributor.author | Tokei, Zsolt | |
| dc.contributor.author | Baklanov, Mikhaïl | |
| dc.contributor.imecauthor | Tokei, Zsolt | |
| dc.date.accessioned | 2021-10-22T21:35:16Z | |
| dc.date.available | 2021-10-22T21:35:16Z | |
| dc.date.issued | 2015 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25723 | |
| dc.identifier.url | http://www2.avs.org/symposium2015/Papers/Paper_EM-ThM5.html | |
| dc.source.beginpage | EM-ThM5 | |
| dc.source.conference | AVS 62nd International Symposium & Exhibition | |
| dc.source.conferencedate | 18/10/2015 | |
| dc.source.conferencelocation | San Jose, CA USA | |
| dc.title | Status update on a new class of solution processable low-k dielectric coating for use as ILD with k <2.4 | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
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