Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Advantages of high vacuum for electrical scanning probe microscopy
Publication:
Advantages of high vacuum for electrical scanning probe microscopy
Copy permalink
Date
2019
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ludwig, Jonathan
;
Mascaro, Marco
;
Celano, Umberto
;
Vandervorst, Wilfried
;
Paredis, Kristof
Journal
Compound Semiconductor
Abstract
Description
Metrics
Views
1877
since deposited on 2021-10-27
3
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1877
since deposited on 2021-10-27
3
last month
Acq. date: 2025-12-15
Citations