Publication:

Study of SiGeAsTe and SiGeAsSe chalcogenide thin films by Raman spectroscopy and understanding of their OTS properties

Date

2024
Journal article
https://doi.org/10.1016/j.jnoncrysol.2024.123175
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dc.contributor.authorKeukelier, Jonas
dc.contributor.authorDevulder, Wouter
dc.contributor.authorSergeant, Stefanie
dc.contributor.authorNuytten, Thomas
dc.contributor.authorMeersschaut, Johan
dc.contributor.authorOpsomer, Karl
dc.contributor.authorDetavernier, Christophe
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorSergeant, Stefanie
dc.contributor.imecauthorNuytten, Thomas
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecSergeant, Stefanie::0000-0001-9923-0903
dc.contributor.orcidimecNuytten, Thomas::0000-0002-5921-6928
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.date.accessioned2025-07-08T08:29:33Z
dc.date.available2024-09-04T17:46:24Z
dc.date.available2025-07-08T08:29:33Z
dc.date.issued2024
dc.description.wosFundingTextThis research was made possible with the financial support of the BOF-UGent GOA-01G01019 project.
dc.identifier.doi10.1016/j.jnoncrysol.2024.123175
dc.identifier.issn0022-3093
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44400
dc.publisherELSEVIER
dc.source.beginpageArt. 123175
dc.source.endpageN/A
dc.source.issue15 November
dc.source.journalJOURNAL OF NON-CRYSTALLINE SOLIDS
dc.source.numberofpages11
dc.source.volume644
dc.subject.keywordsSHORT-RANGE ORDER
dc.subject.keywordsGLASSES
dc.subject.keywordsSB
dc.subject.keywordsCRYSTALLINE
dc.subject.keywordsSCATTERING
dc.title

Study of SiGeAsTe and SiGeAsSe chalcogenide thin films by Raman spectroscopy and understanding of their OTS properties

dc.typeJournal article
dspace.entity.typePublication
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