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Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias
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Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias
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Date
2012-01
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mengehini, Matteo
;
Stocco, Antonio
;
Bertin, Marcon
;
Marcon, Denis
;
Chini, Alessandro
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
Journal
Applied Physics Letters
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1917
since deposited on 2021-10-20
1
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Acq. date: 2025-12-15
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Metrics
Views
1917
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-15
Citations