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A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
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A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
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Date
1998
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Ogier, Jean-Luc
;
Bellens, Rudi
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
Journal
IEEE Trans. Electron Devices
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1987
since deposited on 2021-09-30
2
last month
1
last week
Acq. date: 2026-01-07
Citations
Metrics
Views
1987
since deposited on 2021-09-30
2
last month
1
last week
Acq. date: 2026-01-07
Citations