Publication:
Electrical Atomic Force Microscopy for Nanoelectronics
Date
| dc.contributor.editor | Celano, Umberto | |
| dc.date.accessioned | 2021-10-28T01:04:21Z | |
| dc.date.available | 2021-10-28T01:04:21Z | |
| dc.date.issued | 2019 | |
| dc.identifier.isbn | 978-3-030-15612-1 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/34565 | |
| dc.identifier.url | https://www.springer.com/gp/book/9783030156114 | |
| dc.title | Electrical Atomic Force Microscopy for Nanoelectronics | |
| dc.type | Book | |
| dspace.entity.type | Publication | |
| Files | ||
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