Publication:

Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

2033 since deposited on 2021-09-29
Acq. date: 2025-10-23

Citations

Metrics

Views

2033 since deposited on 2021-09-29
Acq. date: 2025-10-23

Citations