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Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Publication:
Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Date
1995
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bellens, Rudi
;
Habas, Predrag
;
Groeseneken, Guido
;
Maes, Herman
;
Mieville, Jean-Paul
;
Van den bosch, G.
Journal
Microelectronic Engineering
Abstract
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2033
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2033
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations