Publication:
Chiplet Interconnect Repair for Clustered Defects with Minimal Propagation Delay
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-5058-8303 | |
| cris.virtual.orcid | 0000-0001-7325-8836 | |
| cris.virtualsource.department | 8a303854-e9b4-460a-b79d-03df3b3c4394 | |
| cris.virtualsource.department | 52be9e5e-be21-4e16-bad5-1335c497e6fd | |
| cris.virtualsource.orcid | 8a303854-e9b4-460a-b79d-03df3b3c4394 | |
| cris.virtualsource.orcid | 52be9e5e-be21-4e16-bad5-1335c497e6fd | |
| dc.contributor.author | Chuang, Po-Yao | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.date.accessioned | 2026-06-08T11:07:19Z | |
| dc.date.available | 2026-06-08T11:07:19Z | |
| dc.date.issued | 2025 | |
| dc.identifier.doi | 10.1109/ats66998.2025.00021 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/59626 | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.source.beginpage | 73 | |
| dc.source.endpage | 78 | |
| dc.source.journal | 2025 IEEE 34th Asian Test Symposium (ATS) | |
| dc.title | Chiplet Interconnect Repair for Clustered Defects with Minimal Propagation Delay | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-04-24 | |
| imec.internal.source | crawler | |
| Files | ||
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