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p-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substrates
Publication:
p-n junction diagnostics to determine surface and bulk generation/recombination properties of silicon substrates
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Poyai, Amporn
;
Simoen, Eddy
;
Czerwinski, A.
;
Katcki, J.
Journal
J. Electrochem. Soc.
Abstract
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2077
since deposited on 2021-10-06
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Acq. date: 2025-10-25
Citations
Metrics
Views
2077
since deposited on 2021-10-06
437
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations