Publication:

Strain measurements in thin film structures by convergent beam electron diffraction

Date

1996
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Author(s)

Armigliato, A.
;
Balboni, R.
;
Benedetti, A.
;
Frabboni, S.
;
Tixier, A.
;
Vanhellemont, Jan

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Abstract

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1999 since deposited on 2021-09-29
Acq. date: 2026-03-16

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1999 since deposited on 2021-09-29
Acq. date: 2026-03-16

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