Publication:

Capturing wetting states in nanopatterned silicon

Date

2014

Journal article

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Author(s)

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Pourtois, Geoffrey

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Verellen, Niels

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Struyf, Herbert

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Holsteyns, Frank

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Moshchalkov, Victor

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indekeu, joseph

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De Gendt, Stefan

Journal

ACS Nano

Metrics

1981 since deposited on 2021-10-22

Acq. date: 2025-12-11