Publication:

Charge trapping in MOSFETs with HfSiON dielectrics during electrical stressing

Date

2005
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorO'Connor, Robert
dc.contributor.authorHughes, Greg
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-16T03:43:53Z
dc.date.available2021-10-16T03:43:53Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10947
dc.source.beginpage302
dc.source.endpage309
dc.source.issue3_4
dc.source.journalMicroelectronic Engineering
dc.source.volume77
dc.title

Charge trapping in MOSFETs with HfSiON dielectrics during electrical stressing

dc.typeJournal article
dspace.entity.typePublication
Files
Publication available in collections:
Articles