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Electrical characterization of Ge-pFETs with HfO2/TiN metal gate: review of possible defects impacting the hole mobility
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1864 since deposited on 2021-10-18
Acq. date: 2025-12-10
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Views
1864 since deposited on 2021-10-18
Acq. date: 2025-12-10
Citations