Publication:
Electrical characterization of Ge-pFETs with HfO2/TiN metal gate: review of possible defects impacting the hole mobility
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1866 since deposited on 2021-10-18
1last month
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Acq. date: 2026-09-10
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Statistics
Views
1866 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-09-10
Citations