Publication:

Electrical characterization of Ge-pFETs with HfO2/TiN metal gate: review of possible defects impacting the hole mobility

Date

2010

Proceedings Paper

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Author(s)

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Vincent, Benjamin

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De Jaeger, Brice

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De Meyer, Kristin

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Vandervorst, Wilfried

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Hoffmann, Thomas Y.

Statistics

1864 since deposited on 2021-10-18

Acq. date: 2026-02-24