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SIFER: Scale-Invariant Feature Detector with Error Resilience
Publication:
SIFER: Scale-Invariant Feature Detector with Error Resilience
Date
2013
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mainali, Pradip
;
Lafruit, Gauthier
;
Yang, Qiong
;
Geelen, Bert
;
Van Gool, Luc
;
Lauwereins, Rudy
Journal
International Journal of Computer Vision
Abstract
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1883
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Citations
Metrics
Views
1883
since deposited on 2021-10-21
419
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations