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SIFER: Scale-Invariant Feature Detector with Error Resilience
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SIFER: Scale-Invariant Feature Detector with Error Resilience
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Date
2013
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mainali, Pradip
;
Lafruit, Gauthier
;
Yang, Qiong
;
Geelen, Bert
;
Van Gool, Luc
;
Lauwereins, Rudy
Journal
International Journal of Computer Vision
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1885
since deposited on 2021-10-21
Acq. date: 2025-12-12
Citations
Metrics
Views
1885
since deposited on 2021-10-21
Acq. date: 2025-12-12
Citations