Publication:

Scanning Probe Microscopy as a scalpel to probe filament formation in RRAM devices

Date

2013
Meeting abstract
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dc.contributor.authorCelano, Umberto
dc.contributor.authorGoux, Ludovic
dc.contributor.authorOpsomer, Karl
dc.contributor.authorIapichino, Martina
dc.contributor.authorFranquet, Alexis
dc.contributor.authorHoflijk, Ilse
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorHoflijk, Ilse
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.date.accessioned2021-10-21T06:54:27Z
dc.date.available2021-10-21T06:54:27Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22116
dc.source.beginpage59
dc.source.conferenceMaterials for Advanced Metallization - MAM
dc.source.conferencedate10/03/2013
dc.source.conferencelocationLeuven Belgium
dc.source.endpage60
dc.title

Scanning Probe Microscopy as a scalpel to probe filament formation in RRAM devices

dc.typeMeeting abstract
dspace.entity.typePublication
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