Publication:

SILC-related effects in flash E2PROM's - Part I: A quantitative model for steady-state SILC

Date

1998
Journal article
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dc.contributor.authorDe Blauwe, Jan
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorWellekens, Dirk
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-09-30T11:39:09Z
dc.date.available2021-09-30T11:39:09Z
dc.date.embargo9999-12-31
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2478
dc.source.beginpage1745
dc.source.endpage1750
dc.source.issue8
dc.source.journalIEEE Trans. Electron Devices
dc.source.volume45
dc.title

SILC-related effects in flash E2PROM's - Part I: A quantitative model for steady-state SILC

dc.typeJournal article
dspace.entity.typePublication
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