Publication:

Defect loss: a new concept for reliability of MOSFETs

Date

2012

Journal article

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Files

25757.pdf 259.32 KB

Author(s)

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De Gendt, Stefan

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Groeseneken, Guido

Journal

IEEE Electron Device Letters

Statistics

1920 since deposited on 2021-10-20

Acq. date: 2026-02-25