Publication:
Challenges probing next generation full array products with 60μm pitch and below
Date
| dc.contributor.author | Vallauri, Raffaele | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Broz, Jerry | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-22T23:51:57Z | |
| dc.date.available | 2021-10-22T23:51:57Z | |
| dc.date.issued | 2015-06 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26032 | |
| dc.identifier.url | http://www.swtest.org/archive/ | |
| dc.source.conference | IEEE Semiconductor Wafer Test Workshop - SWTW | |
| dc.source.conferencedate | 7/06/2015 | |
| dc.source.conferencelocation | San Diego, CA USA | |
| dc.title | Challenges probing next generation full array products with 60μm pitch and below | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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