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Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2
Publication:
Low-frequency noise assessment 0f 1.8 V input-output bulk FinFETs with ALD SiO2
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Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Hellings, Geert
;
Parvais, Bertrand
;
Ragnarsson, Lars-Ake
;
Dekkers, Harold
;
Schram, Tom
;
Linten, Dimitri
;
Horiguchi, Naoto
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1826
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Acq. date: 2025-12-15
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Views
1826
since deposited on 2021-10-26
1
last month
1
last week
Acq. date: 2025-12-15
Citations