OLIMPEX: measurement and parameter extraction tools for advanced laser diodes

dc.contributor.author	Verhoeve, Piet
dc.contributor.author	Diet, Geert
dc.contributor.author	Sarlet, Gert
dc.contributor.author	Morthier, Geert
dc.contributor.author	Baets, Roel
dc.contributor.author	Farrell, T.
dc.contributor.imecauthor	Morthier, Geert
dc.contributor.imecauthor	Baets, Roel
dc.contributor.orcidimec	Morthier, Geert::0000-0003-1819-6489
dc.contributor.orcidimec	Baets, Roel::0000-0003-1266-1319
dc.date.accessioned	2021-09-30T10:02:41Z
dc.date.available	2021-09-30T10:02:41Z
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2288
dc.source.beginpage	109
dc.source.conference	Proceedings of the Annual Symposium of the IEEE/LEOS Benelux Chapter; November 26, 1997. Eindhoven, The Netherlands.
dc.source.conferencelocation
dc.source.endpage	112
dc.title	OLIMPEX: measurement and parameter extraction tools for advanced laser diodes
dc.type	Proceedings paper
dspace.entity.type	Publication
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