Publication:
Reliability in gate first and gate last Ultra-Thin-EOT gate stacks assessed with CV-eMSM BTI characterization
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1854 since deposited on 2021-10-20
1last month
Acq. date: 2026-04-07
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Statistics
Views
1854 since deposited on 2021-10-20
1last month
Acq. date: 2026-04-07
Citations