Measuring Thermal Conductivity in a Microfluidic Device With the Transient Thermal Offset (TTO) Method

dc.contributor.author	Oudebrouckx, Gilles
dc.contributor.author	Wagner, Patrick Hermann
dc.contributor.author	Vandenryt, Thys
dc.contributor.author	Bormans, Seppe
dc.contributor.author	Thoelen, Ronald
dc.contributor.imecauthor	Oudebrouckx, Gilles
dc.contributor.imecauthor	Vandenryt, Thys
dc.contributor.imecauthor	Bormans, Seppe
dc.contributor.imecauthor	Thoelen, Ronald
dc.contributor.orcidext	Wagner, Patrick Hermann::0000-0002-4028-3629
dc.contributor.orcidimec	Oudebrouckx, Gilles::0000-0001-6278-3547
dc.contributor.orcidimec	Thoelen, Ronald::0000-0001-6845-0866
dc.date.accessioned	2022-06-10T09:19:36Z
dc.date.available	2021-11-02T16:02:41Z
dc.date.available	2022-06-10T09:19:36Z
dc.date.issued	2021
dc.identifier.doi	10.1109/JSEN.2020.3047475
dc.identifier.issn	1530-437X
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/37999
dc.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage	7298
dc.source.endpage	7307
dc.source.issue	6
dc.source.journal	IEEE SENSORS JOURNAL
dc.source.numberofpages	10
dc.source.volume	21
dc.title	Measuring Thermal Conductivity in a Microfluidic Device With the Transient Thermal Offset (TTO) Method
dc.type	Journal article
dspace.entity.type	Publication
Files
Publication available in collections:	Articles

Date