Publication:
Substrate bias effect on the capture kinetics of random telegraph signals in submicron p -channel silicon Metal-Oxide-Semiconductor Transistors
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-09-29T13:16:39Z | |
| dc.date.available | 2021-09-29T13:16:39Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/876 | |
| dc.source.beginpage | 598 | |
| dc.source.endpage | 600 | |
| dc.source.issue | 5 | |
| dc.source.journal | Appl. Phys. Lett. | |
| dc.source.volume | 66 | |
| dc.title | Substrate bias effect on the capture kinetics of random telegraph signals in submicron p -channel silicon Metal-Oxide-Semiconductor Transistors | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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