Publication:
Analysis of the ZTC-Point for Vertically Stacked Nanosheet pMOS Devices
| dc.contributor.author | Coelho, Carlos H. S. | |
| dc.contributor.author | Martino, Joao A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Veloso, Anabela | |
| dc.contributor.author | Agopian, Paula G. D. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Veloso, Anabela | |
| dc.contributor.orcidext | Coelho, Carlos H. S.::0000-0003-0412-4476 | |
| dc.contributor.orcidext | Martino, Joao A.::0000-0001-8121-6513 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2023-08-09T10:02:07Z | |
| dc.date.available | 2023-06-20T10:39:48Z | |
| dc.date.available | 2023-08-09T10:02:07Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/LAEDC51812.2021.9437935 | |
| dc.identifier.eisbn | 978-1-6654-1510-1 | |
| dc.identifier.issn | na | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42065 | |
| dc.publisher | IEEE | |
| dc.source.conference | Latin America Electron Devices Conference (LAEDC) | |
| dc.source.conferencedate | APR 19-21, 2021 | |
| dc.source.conferencelocation | Mexico | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.subject.keywords | ZERO-TEMPERATURE-COEFFICIENT | |
| dc.subject.keywords | DEGRADATION | |
| dc.subject.keywords | MOBILITY | |
| dc.title | Analysis of the ZTC-Point for Vertically Stacked Nanosheet pMOS Devices | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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