Publication:

WS2 MOSFETs: significant performance improvement with Mg contacts

Date

2019
Proceedings Paper
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dc.contributor.authorSutar, Surajit
dc.contributor.authorMongillo, Massimo
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorAsselberghs, Inge
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorCaymax, Matty
dc.contributor.authorLin, Dennis
dc.contributor.authorRadu, Iuliana
dc.contributor.imecauthorSutar, Surajit
dc.contributor.imecauthorMongillo, Massimo
dc.contributor.imecauthorAsselberghs, Inge
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecMongillo, Massimo::0000-0002-6475-6320
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.accessioned2021-10-27T19:16:07Z
dc.date.available2021-10-27T19:16:07Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34089
dc.identifier.urlhttps://iitc-conference.org/2019-iitc-mam-program/
dc.source.beginpage4.28
dc.source.conferenceIEEE International Interconnect Technology Conference (IITC 2019) and Materials for Advanced Metallization Conference (MAM 2019)
dc.source.conferencedate3/06/2019
dc.source.conferencelocationBrussels Belgium
dc.title

WS2 MOSFETs: significant performance improvement with Mg contacts

dc.typeProceedings paper
dspace.entity.typePublication
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