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Do's and don'ts for SiPho heater qualification

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dc.contributor.authorCroes, Kristof
dc.contributor.authorDing, Youqi
dc.contributor.authorVarela Pedreira, Olalla
dc.contributor.authorCoenen, David
dc.contributor.authorTsiara, Artemisia
dc.contributor.authorRoussel, Philippe
dc.contributor.authorSaleh, Ahmed
dc.contributor.authorLofrano, Melina
dc.contributor.authorZahedmanesh, Houman
dc.contributor.authorChavez, T.
dc.contributor.authorFarr, H.
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorDing, Y.
dc.contributor.imecauthorPedreira, O. Varela
dc.contributor.imecauthorCoenen, D.
dc.contributor.imecauthorTsiara, A.
dc.contributor.imecauthorRoussel, Ph.
dc.contributor.imecauthorSaleh, A.
dc.contributor.imecauthorLofrano, M.
dc.contributor.imecauthorZahedmanesh, H.
dc.contributor.imecauthorDe Wolf, I.
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.date.accessioned2025-07-25T04:01:10Z
dc.date.available2025-07-25T04:01:10Z
dc.date.issued2025
dc.description.abstractRecommended practices for SiPho heater qualification and design are outlined. Regarding heater qualification, the importance of proper thermal modelling and failure analysis to accurately determine the failure location and its temperature is highlighted. Also, it is motivated that properly accounting for thermal gradients at the failure location is crucial for a proper lifetime extrapolation. It will be shown that only by considering these two items (temperature at failure location and thermal gradients), accurate lifetime predictions can be obtained. Regarding heater design, potential ways to slow down failures and to decrease the temperature at the failure location are discussed.
dc.identifier.doi10.1117/12.3040661
dc.identifier.eisbn978-1-5106-8489-8
dc.identifier.isbn978-1-5106-8488-1
dc.identifier.issn0277-786X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45931
dc.publisherSPIE-INT SOC OPTICAL ENGINEERING
dc.source.beginpage1337007-1
dc.source.conference2025 Conference on Smart Photonic and Optoelectronic Integrated Circuits
dc.source.conferencedate2025-03-19
dc.source.conferencelocationSan Francisco
dc.source.endpage1337007-4
dc.source.journalProceedings of SPIE
dc.source.numberofpages4
dc.subject.keywordsELECTROMIGRATION
dc.title

Do's and don'ts for SiPho heater qualification

dc.typeProceedings paper
dspace.entity.typePublication
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