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Atomic layer deposition of ruthenium thin films from (ethylbenzyl) (1-ethyl-1,4-cyclohexadienyl) Ru: process characteristics, surface chemistry, and film properties
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Atomic layer deposition of ruthenium thin films from (ethylbenzyl) (1-ethyl-1,4-cyclohexadienyl) Ru: process characteristics, surface chemistry, and film properties
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Popovici, Mihaela Ioana
;
Groven, Benjamin
;
Marcoen, Kristof
;
Phung, Quan
;
Dutta, Shibesh
;
Swerts, Johan
;
Meersschaut, Johan
;
Van den Berg, Jaap
;
Franquet, Alexis
;
Moussa, Alain
;
Vanstreels, Kris
;
Lagrain, Pieter
;
Bender, Hugo
;
Jurczak, Gosia
;
Van Elshocht, Sven
;
Delabie, Annelies
;
Adelmann, Christoph
Journal
Chemistry of Materials
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1997
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations
Metrics
Views
1997
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations