Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
In depth analysis of 3D NAND enablers in gate stack integration and demonstration in 3D devices
Publication:
In depth analysis of 3D NAND enablers in gate stack integration and demonstration in 3D devices
Date
2017
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
35859.pdf
942.6 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tan, Chi Lim
;
Lavizzari, Simone
;
Blomme, Pieter
;
Breuil, Laurent
;
Vecchio, Emma
;
Sebaai, Farid
;
Paraschiv, Vasile
;
Tao, Zheng
;
Schepers, Bart
;
Nyns, Laura
;
Peter, Antony
;
Dekkers, Harold
;
Ong, Patrick
;
Tsvetanova, Diana
;
Devriendt, Katia
;
Teugels, Lieve
;
Heylen, Nancy
;
Raymaekers, Tom
;
Jossart, Nico
;
Mennella, Pasquale
;
Delhougne, Romain
;
Vadakupudhu Palayam, Senthil
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Furnemont, Arnaud
Journal
Abstract
Description
Metrics
Views
1965
since deposited on 2021-10-24
Acq. date: 2025-10-22
Citations
Metrics
Views
1965
since deposited on 2021-10-24
Acq. date: 2025-10-22
Citations